DocumentCode :
2234672
Title :
Proceedings 6/sub th/ IEEE International On-Line Testing Workshop
fYear :
2000
fDate :
3-5 July 2000
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
Conference_Location :
Palma de Mallorca, Spain
Print_ISBN :
0-7695-0646-1
Type :
conf
DOI :
10.1109/OLT.2000.856603
Filename :
856603
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2234672