Title :
Ferroelectric, pyroelectric and piezoelectric studies in Ba5SmTi3Nb7O30 ceramic
Author :
Ganguly, Prasun ; Devi, Sheela ; Jha, A.K. ; Deori, K.L.
Author_Institution :
Dept. of Appl. Phys., Delhi Technol. Univ., Delhi, India
Abstract :
In the present work, the polycrystalline sample of Ba5SmTi3Nb7O30, a member of tungsten bronze family, was prepared by solid-state reaction method and studied for their ferroelectric, pyroelectric and piezoelectric properties. X-ray diffraction (XRD) analysis reveals the formation of single-phase compound with an orthorhombic structure. The grain morphology of the sample has been investigated by scanning electron microscopy. The average grain size of the compound is observed to be in the range of 2 mum. The temperature variations of polarization-electric field (P-E) loops of the compound have been reported. The remanent polarization (2Pr) value of the compound is found to be ~ 2.3 muC/cm2 at room temperature. The variation of pyroelectric coefficient with temperature is reported. Pyroelectric figure of merit have been calculated from the pyroelectric coefficients. Piezoelectric coefficients (d33 and g33) of the compound have also been measured.
Keywords :
X-ray diffraction; barium compounds; ceramics; crystal structure; dielectric hysteresis; dielectric materials; dielectric polarisation; materials preparation; piezoelectricity; pyroelectricity; samarium compounds; scanning electron microscopy; titanium compounds; Ba5SmTi3Nb7O30; X-ray diffraction analysis; XRD; ceramics; electric field loops; ferroelectric properties; grain morphology; grain size; orthorhombic structure; piezoelectric coefficients; polycrystalline sample; pyroelectric coefficient; pyroelectric figure of merit; remanent polarization; room temperature; scanning electron microscopy; single-phase compound; solid-state reaction method; temperature 293 K to 298 K; tungsten bronze family; Ferroelectric materials; Morphology; Niobium; Piezoelectric polarization; Pyroelectricity; Solid state circuits; Temperature; Tungsten; X-ray diffraction; X-ray scattering;
Conference_Titel :
Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
Conference_Location :
Xian
Print_ISBN :
978-1-4244-4970-5
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2009.5307605
