Electron microscopy study of ferroelectric domains and microstructural defects in Bi- and Zn-modified Pb(Ni1/3Nb2/3)O3-PbZrO3-PbTiO3 piezoelectric ceramics

Author

Zhu, X.H. ; Song, Y. ; Zhu, J.M. ; Zhou, S.H. ; Liu, Z.G.

Author_Institution

Dept. of Phys., Nanjing Univ., Nanjing, China

fYear

2009

fDate

23-27 Aug. 2009

Firstpage

1

Lastpage

4

Abstract

Ferroelectric domain configurations and microstructural defects in the Bi- and Zn-modified Pb(Ni_1/3Nb_2/3)O₃-PbZrO₃-PbTiO₃ piezoelectric ceramics were investigated by transmission electron microscopy (TEM) and selected area electron diffraction. In the samples with tetragonal symmetry, labyrinthic domain configurations with 90deg a-c domains were observed besides the herringbone-like configuration, parallel band-shaped and/or wedge-shaped domains. Polar nanodomains with local random contrast were observed in the samples with rhombohedral symmetry but close to the paraelectric phase region, and the effects of electron beam irradiation on the local random diffraction contrast were also studied. Microstructural defect such as anti-phase boundaries in this piezoelectric system was also revealed by TEM.

Keywords

antiphase boundaries; bismuth compounds; electric domains; electron beam effects; electron diffraction; lead compounds; nanostructured materials; nickel compounds; niobium compounds; piezoceramics; transmission electron microscopy; zinc compounds; (Pb_0.985Bi_0.01)(Ni_0.25Zn_0.083Nb_0.666)_0.6(Zr_0.1Ti_0.9)_0.4O₃; TEM; antiphase boundaries; electron beam irradiation; ferroelectric domain configuration; labyrinthic domain configuration; microstructural defects; paraelectric phase region; parallel band-shaped domains; piezoelectric ceramics; polar nanodomains; rhombohedral symmetry; selected area electron diffraction; tetragonal symmetry; transmission electron microscopy; wedge-shaped domains; Bioceramics; Ceramics; Diffraction; Electron beams; Electron microscopy; Ferroelectric materials; Polarization; Sensor arrays; Solid state circuits; Transmission electron microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the

Conference_Location

Xian

ISSN

1099-4734

Print_ISBN

978-1-4244-4970-5

Electronic_ISBN

1099-4734

Type

conf

DOI

10.1109/ISAF.2009.5307606

Filename

5307606