Title :
Terahertz spectroscopy of Ni-Ti alloy thin films
Author :
Jameson, A.D. ; Tomaino, J.L. ; Kevek, J.W. ; Paul, M.J. ; Hemphill-Johnston, M. ; Ong, J. ; Koretsky, M.D. ; Minot, E.D. ; Lee, Yun-Shik
Author_Institution :
Dept. of Phys., Oregon State Univ., Corvallis, OR, USA
Abstract :
Using THz spectroscopy, we obtained the resistivity of Ni-Ti alloy thin-films as a function of Ti concentration. The resistivity sharply increases near the phase transition boundaries, Ti concentrations of 22%, 44% and 62%.
Keywords :
nickel alloys; optical properties; phase transformations; terahertz spectroscopy; terahertz wave imaging; titanium alloys; NiTi; alloy thin films; phase transition boundaries; terahertz spectroscopy; Conductivity; Metals; Optical films; Optical imaging; Optical pulses; Silicon;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
