DocumentCode :
2234943
Title :
Semiconductor business, process, product and fab influence on throughput, cycle time and chip cost
Author :
Kraft, Chris
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
1996
fDate :
12-14 Nov 1996
Firstpage :
119
Lastpage :
139
Abstract :
This paper discusses some of the manufacturing methods being developed at Texas Instruments Inc. to improve fab productivity. It also addresses the need for a common language across business to better understand the interdependency between business, create, and build functions and their influence on fab throughput, cycle time and chip cost
Keywords :
economics; human resource management; integrated circuit manufacture; IC manufacturing methods; Texas Instruments; business; chip cost; cycle time; fab productivity; interdependency; throughput; Costs; Cultural differences; Instruments; Manufacturing processes; Portfolios; Product design; Production facilities; Productivity; Throughput; Waste management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
Conference_Location :
Cambridge, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-3371-3
Type :
conf
DOI :
10.1109/ASMC.1996.557984
Filename :
557984
Link To Document :
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