DocumentCode
2234953
Title
A study of the effects of transient fault injection into the VHDL model of a fault-tolerant microcomputer system
Author
Gil, D. ; Gracia, J. ; Baraza, J.C. ; Gil, P.J.
Author_Institution
Dept. de Sistemas Inf. y Comput., Univ. Politecnica de Valencia, Spain
fYear
2000
fDate
2000
Firstpage
73
Lastpage
79
Abstract
This work presents a campaign of fault injection to validate the dependability of a fault tolerant microcomputer system. The system is duplex with cold stand-by sparing, parity detection and a watchdog timer. The faults have been injected on a chip-level VHDL model, using an injection tool designed for this purpose. We have carried out a set of injection experiments (with 3000 injections each), injecting transient faults of types stuck-at, bit-flip, indetermination and delay on both the signals and variables of the system, running two different workloads. We have analysed the pathology of the propagated errors, measured their latency, and calculated both detection and recovery coverage. For instance, system detection coverages (including non-effective errors) up to 98%, and system recovery coverage up to 94% have been obtained for short transient faults
Keywords
delays; fault tolerant computing; hardware description languages; system recovery; transient analysis; bit-flip faults; chip-level VHDL model; cold stand-by sparing; delay; dependability; duplex system; fault-tolerant microcomputer system; indetermination; latency; noneffective errors; parity detection; recovery coverage; stuck-at faults; system detection; transient fault injection; watchdog timer; Circuit faults; Computational modeling; Emulation; Fault detection; Fault tolerance; Fault tolerant systems; Gas insulated transmission lines; Hardware; Microcomputers; Pathology;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
Conference_Location
Palma de Mallorca
Print_ISBN
0-7695-0646-1
Type
conf
DOI
10.1109/OLT.2000.856615
Filename
856615
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