Title :
Transient bitflip injection in microprocessor embedded applications
Author :
Velazco, R. ; Rezgui, S.
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
This paper investigates a new methodology for transient bitflip injection, randomly in time and location, in microprocessor-based digital architectures. Experimental results performed on two different architectures illustrate the potentials of this new strategy
Keywords :
embedded systems; microprocessor chips; radiation effects; space vehicle electronics; transients; digital architectures; microprocessor embedded applications; radiation effects; space vehicle electronics; transient bitflip injection; Digital systems; Error analysis; Laboratories; Microprocessors; Particle beams; Performance evaluation; Radio access networks; Read only memory; Registers; Testing;
Conference_Titel :
On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
Conference_Location :
Palma de Mallorca
Print_ISBN :
0-7695-0646-1
DOI :
10.1109/OLT.2000.856616
