DocumentCode
2234965
Title
Transient bitflip injection in microprocessor embedded applications
Author
Velazco, R. ; Rezgui, S.
Author_Institution
TIMA Lab., Grenoble, France
fYear
2000
fDate
2000
Firstpage
80
Lastpage
84
Abstract
This paper investigates a new methodology for transient bitflip injection, randomly in time and location, in microprocessor-based digital architectures. Experimental results performed on two different architectures illustrate the potentials of this new strategy
Keywords
embedded systems; microprocessor chips; radiation effects; space vehicle electronics; transients; digital architectures; microprocessor embedded applications; radiation effects; space vehicle electronics; transient bitflip injection; Digital systems; Error analysis; Laboratories; Microprocessors; Particle beams; Performance evaluation; Radio access networks; Read only memory; Registers; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
Conference_Location
Palma de Mallorca
Print_ISBN
0-7695-0646-1
Type
conf
DOI
10.1109/OLT.2000.856616
Filename
856616
Link To Document