• DocumentCode
    2235025
  • Title

    A compact built-in current sensor for IDDQ testing

  • Author

    Tsiatouhas, Y. ; Haniotakis, Th ; Nikolos, D.

  • Author_Institution
    Dept. of Comput. Eng. & Inf., Patras Univ., Greece
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    95
  • Lastpage
    99
  • Abstract
    In this paper a simple to implement, compact, build-in current sensor for IDDQ testing of CMOS VLSI circuits based on current mirroring techniques is proposed. This sensor can attain small detection times and can be used for both on-line and off-line IDDQ testing
  • Keywords
    CMOS integrated circuits; VLSI; built-in self test; current mirrors; integrated circuit testing; CMOS; IDDQ testing; VLSI; built-in current sensor; current mirroring techniques; detection times; off-line testing; on-line testing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
  • Conference_Location
    Palma de Mallorca
  • Print_ISBN
    0-7695-0646-1
  • Type

    conf

  • DOI
    10.1109/OLT.2000.856619
  • Filename
    856619
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2235025