• DocumentCode
    2235038
  • Title

    Unusually stable ferroelectric 180° a-a nanostripe and nanoneedle domains in thin films prepared from a bulk single crystal of BaTiO3 with FIB: TEM observations and phase-field simulations

  • Author

    Matsumoto, Takao ; Okamoto, Masakuni

  • Author_Institution
    Central Res. Lab., Hitachi, Ltd., Kokubunji, Japan
  • fYear
    2009
  • fDate
    23-27 Aug. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Unusually stable ferroelectric 180deg a-a nanostripe domain structure in a thin (les100 nm) film prepared from a bulk single crystal of BaTiO3 with focused-ion beam (FIB) was observed by transmission electron microscopy (TEM). The domain consists of alternate sequences of narrow and wide anti-parallel domains. High-magnification images of a stable 180deg nanoneedle domain, with a sharp tip penetrating into the nanostripe domains, were also obtained. Two-dimensional phase-field simulations based on TDGL equations suggest that such a domain structure is stabilized by an in-plane anisotropic stress and an anisotropic mechanical boundary condition of the thin film prepared with FIB.
  • Keywords
    barium compounds; electric domains; ferroelectric thin films; focused ion beam technology; nanofabrication; nanostructured materials; transmission electron microscopy; BaTiO3; FIB; TDGL equations; TEM; anisotropic stress; focused-ion beam; mechanical boundary condition; nanoneedle domains; phase-field simulations; sharp tip penetration; stable ferroelectric nanostripe films; transmission electron microscopy; Anisotropic magnetoresistance; Electron beams; Equations; Ferroelectric films; Ferroelectric materials; Focusing; Nanostructures; Stress; Transistors; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
  • Conference_Location
    Xian
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-4970-5
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2009.5307617
  • Filename
    5307617