Title :
An improved CMOS BICS for on-line testing
Author :
Maidon, Y. ; Deval, Y. ; Begueret, J.B.
Author_Institution :
Lab. IXL, Bordeaux I Univ., Talence, France
Abstract :
Dedicated to a wide range of power supplies current monitoring, a new version of a CMOS built-in current sensor is proposed. It takes advantage of the classical parasitic resistor attached to an interconnection layer, as well as to a feedback circuit with high static gain capability. Analysis and simulation reveal that the transducer is accurate, linear and transparent. Process dependencies are taken into account. The sensor was designed in a 0.6 μm technology and its simulated characteristics are reported in this paper
Keywords :
CMOS integrated circuits; built-in self test; circuit feedback; circuit simulation; integrated circuit interconnections; integrated circuit testing; monitoring; 0.6 micron; BICS; CMOS; built-in current sensor; feedback circuit; interconnection layer; on-line testing; parasitic resistor; power supplies current monitoring; process dependencies; simulated characteristics; static gain capability; Analytical models; Circuit simulation; Circuit testing; Current supplies; Feedback circuits; Integrated circuit interconnections; Monitoring; Power supplies; Resistors; Transducers;
Conference_Titel :
On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International
Conference_Location :
Palma de Mallorca
Print_ISBN :
0-7695-0646-1
DOI :
10.1109/OLT.2000.856620
