DocumentCode
2235419
Title
Process Capability Improvement in a Student Run Integrated Circuit Factory
Author
Fuller, L.F. ; Waldrop, P.C. ; Hirschman, K.D.
Author_Institution
Microelectronic Engineering Rochester Institute of Technology, NY
fYear
1993
fDate
18-19 Oct 1993
Firstpage
172
Lastpage
177
Keywords
Engineering management; Gaussian distribution; Laboratories; Manufacturing; Microelectronics; Production facilities; Production systems; Project management; Six sigma; Total quality management;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1993. ASMC 93 Proceedings. IEEE/SEMI
Type
conf
DOI
10.1109/ASMC.1993.682506
Filename
682506
Link To Document