DocumentCode :
2235419
Title :
Process Capability Improvement in a Student Run Integrated Circuit Factory
Author :
Fuller, L.F. ; Waldrop, P.C. ; Hirschman, K.D.
Author_Institution :
Microelectronic Engineering Rochester Institute of Technology, NY
fYear :
1993
fDate :
18-19 Oct 1993
Firstpage :
172
Lastpage :
177
Keywords :
Engineering management; Gaussian distribution; Laboratories; Manufacturing; Microelectronics; Production facilities; Production systems; Project management; Six sigma; Total quality management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1993. ASMC 93 Proceedings. IEEE/SEMI
Type :
conf
DOI :
10.1109/ASMC.1993.682506
Filename :
682506
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2235419
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