DocumentCode :
2235790
Title :
Blending Luminance Uniformity Matrix: A New Robust Photometric Calibration in Multi-Projector Systems
Author :
Chen, Zhecui ; Yang, Xubo ; Xiao, Shuangjiu ; Hou, Pengyan
Author_Institution :
MOE-Microsoft Lab. for Intell. Comput. & Intell. Syst. (Digital Art Lab.), Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2009
fDate :
26-28 Dec. 2009
Firstpage :
1183
Lastpage :
1186
Abstract :
Large-scale displays as multi-projector systems are used in scientific visualization, virtual reality and other visually intensive applications. It always needs complicated photometric calibration in multi-projector systems. The most popular methods of photometric calibration can be generalized into two types: edge blending and LAM (luminance attenuation maps). Unfortunately, both these two methods have their drawbacks. In this paper, we provide a new method which combines the blending with luminance attenuation by slightly reducing the area of luminance attenuation in overlapped region, which efficiently solves the problem of "luminance inconsistency in the edge of overlapped region" in LAM and the problem of "un-global luminance uniformity" in blending. In addition, instead of finding the minimum common luminance value in the photometric calibration, we just find a more suitable common luminance value which can well solve the dim problem in camera-based photometric uniformity of prior approaches. Moreover, the process of photometric calibration on multi-projecting system will be no more complicated than before. The method is robust and accurate, and can be implemented with commercial off-the-shelf components.
Keywords :
blending; brightness; computer displays; display devices; photometry; LAM; blending luminance uniformity matrix; edge blending; large-scale displays; luminance attenuation maps; multiprojector systems; photometric calibration; scientific visualization; virtual reality; Attenuation; Calibration; Computer displays; Digital art; Information science; Intelligent systems; Laboratories; Pattern recognition; Photometry; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Science and Engineering (ICISE), 2009 1st International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-4909-5
Type :
conf
DOI :
10.1109/ICISE.2009.363
Filename :
5455655
Link To Document :
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