Analytic correction for probe-position errors in spherical near-field measurements

A recently developed analytic technique that can correct for probe-position errors in planar near-field measurements to arbitrary accuracy, Muth and Lewis (1988, 1990), is shown to be also applicable to spherical near-field data after appropriate modifications. The method has been used successfully to remove probe-position errors in the planar near field, leading to more accurate far-field patterns, even if the maximum error in the probe´s position is as large as 0.2 λ. Only the error-contaminated near-field measurements and an accurate probe-position error function are needed to be able to implement the correction technique