Title :
PRBS Test Signature Analysis of Switched Current Circuit
Author :
Guo Jiegong ; Yigang, He ; Cai Xinhua
Author_Institution :
Inst. of Inf. Technol., Hunan Univ. of Arts & Sci., Changde, China
Abstract :
A PRBS tested signature analysis method that is based on the excitation of the switched current circuits with pseudo random sequence and the subsequent analysis of the captured response is proposed in this paper. It has taken into account of the connection between special structural problems and CMOS´s parameters in switched current circuits such as the drain-gate capacitance Cdg, gate-source capacitance Cgs and transconductance gm. The fault detection capabilities of the test and data analysis methods demonstrated by applying them to variant switched current filter circuit.
Keywords :
CMOS integrated circuits; fault diagnosis; filters; integrated circuit testing; switched current circuits; CMOS parameter; PRBS test signature analysis; drain gate capacitance; fault detection; gate-source capacitance; pseudo random sequence; structural problem; switched current circuit; switched current filter circuit; transconductance; Autocorrelation; Capacitance; Circuit faults; Circuit testing; Filters; Information analysis; Information science; Pulse measurements; Random sequences; Switching circuits;
Conference_Titel :
Information Science and Engineering (ICISE), 2009 1st International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-4909-5
DOI :
10.1109/ICISE.2009.842
