Title :
Dispositioning defective but reworkable product
Author :
Lagacy, Laurie ; Gaboriault, Maurice, Jr.
Author_Institution :
Microelectron. Div., IBM Corp., Essex Junction, VT, USA
Abstract :
This paper describes the various advantages and disadvantages of implementing a recon vs. a catch-up program for defective but reworkable product at an IBM Microelectronics Division semiconductor fabricator in Essex Junction, Vermont
Keywords :
economics; integrated circuit manufacture; integrated circuit reliability; integrated circuit yield; logic devices; IBM Microelectronics; catch-up program; defective product; logic devices; production lines; reconditioning; reworkable product; semiconductor fabricator; Containers; Fabrication; Flowcharts; Inspection; Job shop scheduling; Lithography; Logic devices; Microelectronics; Product codes; Radio access networks;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-3371-3
DOI :
10.1109/ASMC.1996.558009
