Title :
2007 ROCS Workshop [Title Page]
Abstract :
The following topics are dealt with: accelerated lifetest techniques; reliability studies of advanced HEMTs; reliability and failure analysis tools.
Keywords :
failure analysis; high electron mobility transistors; life testing; semiconductor device reliability; semiconductor device testing; HEMT; accelerated lifetest techniques; compound semiconductors reliability; failure analysis tools; reliability analysis tools;
Conference_Titel :
ROCS Workshop, 2007.[Reliability of Compound Semiconductors Digest]
Conference_Location :
Portland, OR
Print_ISBN :
978-0-7908-0115-5
DOI :
10.1109/ROCS.2007.4391050
