Title :
Diagnosis of SoC faulty memory cells for embedded repair
Author :
Hahanov, Vladimir ; Litvinova, Eugenia ; Krasnoyaruzhskaya, Karina ; Galagan, Sergey
Author_Institution :
Comput. Eng. Fac., Kharkov Nat. Univ. of Radioelectron., Kharkov, Ukraine
Abstract :
A method of optimal memory fault repair that differs from analogs by application of algebra-logical technology of fault covering by two-dimensional memory matrix topology is proposed. It results in obtaining minimal and full solutions for subsequent repair in real time, which is based on utilization of spares in memory rows and columns.
Keywords :
algebra; digital storage; fault diagnosis; network topology; system-on-chip; SoC faulty memory cells; algebra-logical technology; embedded repair; fault covering; fault diagnosis; memory columns; memory fault repair; memory rows; two-dimensional memory matrix topology; Boolean functions; Construction industry; Maintenance engineering; Measurement; Minimization; Real time systems; System-on-a-chip;
Conference_Titel :
Design & Test Symposium (EWDTS), 2008 East-West
Conference_Location :
Lviv
Print_ISBN :
978-1-4244-3402-2
Electronic_ISBN :
978-1-4244-3403-9
DOI :
10.1109/EWDTS.2008.5580144
