Title :
Integrated optical refractometer based on multimode interference
Author :
Viegas, J. ; Mayeh, M. ; Marques, P. ; Farahi, F.
Author_Institution :
Center for Optoelectron. & Opt. Commun, U. North Carolina, Charlotte, NC, USA
Abstract :
An integrated optical refractometer based on multimode interference, with sensitivity enhancement due to sub-micrometer axial features, is demonstrated with experimental sensitivity as high as 3200 nm/RIU and resolution limits on the order of 5 ppm.
Keywords :
integrated optics; light interference; refractometers; integrated optical refractometer; multimode interference; sensitivity enhancement; sub-micrometer axial features; Interference; Optical refraction; Optical sensors; Optical variables control; Refractive index; Temperature sensors;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
