Automatic bipolar ASIC wafer testing up to 5 GHz

A test system for manufacturing that addresses the need for high-speed automatic wafer testing of medium-pin-count, bipolar, application-specific integrated circuits (ASICs) is described. A test system bandwidth of 4.5 GHz and other capabilities are exhibited using a typical mixed-signal wide-bandwidth trigger circuit as the device under test. The test setup, test plan, and results are discussed, and test limitations are examined. The significance of this test system is that AC tests can be performed simultaneously with DC tests at frequencies covering the bandwidth of most current bipolar production technologies