Automatic bipolar ASIC wafer testing up to 5 GHz

Author

Hamling, Daniel T.

Author_Institution

Hewlett Packard Co., Santa Clara, CA, USA

fYear

1989

fDate

18-19 Sep 1989

Firstpage

271

Lastpage

274

Abstract

A test system for manufacturing that addresses the need for high-speed automatic wafer testing of medium-pin-count, bipolar, application-specific integrated circuits (ASICs) is described. A test system bandwidth of 4.5 GHz and other capabilities are exhibited using a typical mixed-signal wide-bandwidth trigger circuit as the device under test. The test setup, test plan, and results are discussed, and test limitations are examined. The significance of this test system is that AC tests can be performed simultaneously with DC tests at frequencies covering the bandwidth of most current bipolar production technologies

Keywords

application specific integrated circuits; automatic testing; bipolar integrated circuits; integrated circuit testing; production testing; 4.5 GHz; AC tests; DC tests; application-specific integrated circuits; automatic wafer testing; bipolar ASIC wafer testing; bipolar production technologies; manufacturing; mixed-signal wide-bandwidth trigger circuit; test system bandwidth; Application specific integrated circuits; Automatic testing; Bandwidth; Circuit testing; Integrated circuit manufacture; Integrated circuit testing; Manufacturing automation; Performance evaluation; System testing; Trigger circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Bipolar Circuits and Technology Meeting, 1989., Proceedings of the 1989

Conference_Location

Minneapolis, MN

Type

conf

DOI

10.1109/BIPOL.1989.69506

Filename

69506