Title :
Application of a Markov model to the measurement, simulation, and diagnosis of an iterative design process
Author :
Johnson, Eric W. ; Castillo, Luis A. ; Brockman, Jay B.
Author_Institution :
Dept. of Comput. Sci. & Eng., Notre Dame Univ., IN, USA
Abstract :
This paper presents the use of a Markov-based model for analyzing iterative design processes. Techniques are developed for collecting process metadata and calibrating the model. An experiment is described that demonstrates the utility and accuracy of the model for simulating design processes and identifying design process bottlenecks
Keywords :
CAD; Markov processes; design engineering; management science; Markov model; design process bottlenecks; diagnosis; iterative design process; measurement; process metadata; simulation; Analytical models; Application software; Computational modeling; Computer science; Computer simulation; Design automation; Design engineering; Permission; Power system modeling; Process design;
Conference_Titel :
Design Automation Conference Proceedings 1996, 33rd
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-3294-6
DOI :
10.1109/DAC.1996.545569
