DocumentCode :
2236866
Title :
High-resolution mapping of electric field inside organic optoelectronic devices
Author :
Celebrano, M. ; Sciascia, C. ; Cerullo, G. ; Lanzani, G. ; Gonzalez, J. Cabanillas
Author_Institution :
Dipt. di Fis., Politec. di Milano, Milan
fYear :
2008
fDate :
4-9 May 2008
Firstpage :
1
Lastpage :
2
Abstract :
By combining confocal microscopy with electroreflectance spectroscopy we directly map electric field amplitude distribution between electrodes in a prototypical organic semiconductor device. We demonstrate this approach on a copper phthalocyanine photodetector.
Keywords :
electric fields; electrodes; optoelectronic devices; organic semiconductors; photodetectors; confocal microscopy; electric field amplitude distribution; electroreflectance spectroscopy; high-resolution mapping; organic optoelectronic devices; phthalocyanine photodetector; Atomic force microscopy; Electrodes; Erbium; Gold; Optical films; Optical sensors; Optoelectronic devices; Reflectivity; Spatial resolution; Spectroscopy; 160.4890 (Organic Materials); 180.1790 (Confocal microscopy); 230.2090 (Electro-optical devices);
fLanguage :
English
Publisher :
iet
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
Type :
conf
Filename :
4571483
Link To Document :
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