• DocumentCode
    2237314
  • Title

    Easiness assumptions and hardness tests: trading time for zero error

  • Author

    Kabanets, Valentine

  • Author_Institution
    Dept. of Comput. Sci., Toronto Univ., Ont., Canada
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    150
  • Lastpage
    157
  • Abstract
    We propose a new approach towards derandomization in the uniform setting, where it is computationally hard to find possible mistakes in the simulation of a given probabilistic algorithm. The approach consists in combining both easiness and hardness complexity assumptions: if a derandomization method based on an easiness assumption fails, then we obtain a certain hardness test that can be used to remove error in BPP algorithms. As an application, we prove that every RP algorithm can be simulated by a zero-error probabilistic algorithm, running in expected subexponential time, that appears correct infinitely often (i.o.) to every efficient adversary. A similar result by Impagliazzo and Wigderson (1998) states that BPP allows deterministic subexponential-time simulations that appear correct with respect to any efficiently sampleable distribution i.o., under the assumption that EXP≠BPP; in contrast, our result does not rely on any unproven assumptions. As another application of our techniques, we get the following gap theorem for ZPP: either every RP algorithm can be simulated by a deterministic subexponential-time algorithm that appears correct i.o. to every efficient adversary, or EXP=ZPP. In particular this implies that if ZPP is somewhat easy, e.g., ZPP⊆DTIME(2(nc)) for some fixed constant c, then RP is subexponentially easy in the uniform setting described above
  • Keywords
    computational complexity; randomised algorithms; derandomization; deterministic subexponential-time algorithm; deterministic subexponential-time simulations; easiness assumptions; hardness complexity assumptions; hardness tests; probabilistic algorithm; subexponential time; trading time; uniform setting; zero error; zero-error probabilistic algorithm; Boolean functions; Circuits; Computational modeling; Computer errors; Computer science; Computer simulation; Polynomials; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Complexity, 2000. Proceedings. 15th Annual IEEE Conference on
  • Conference_Location
    Florence
  • ISSN
    1093-0159
  • Print_ISBN
    0-7695-0674-7
  • Type

    conf

  • DOI
    10.1109/CCC.2000.856746
  • Filename
    856746