DocumentCode :
2237314
Title :
Easiness assumptions and hardness tests: trading time for zero error
Author :
Kabanets, Valentine
Author_Institution :
Dept. of Comput. Sci., Toronto Univ., Ont., Canada
fYear :
2000
fDate :
2000
Firstpage :
150
Lastpage :
157
Abstract :
We propose a new approach towards derandomization in the uniform setting, where it is computationally hard to find possible mistakes in the simulation of a given probabilistic algorithm. The approach consists in combining both easiness and hardness complexity assumptions: if a derandomization method based on an easiness assumption fails, then we obtain a certain hardness test that can be used to remove error in BPP algorithms. As an application, we prove that every RP algorithm can be simulated by a zero-error probabilistic algorithm, running in expected subexponential time, that appears correct infinitely often (i.o.) to every efficient adversary. A similar result by Impagliazzo and Wigderson (1998) states that BPP allows deterministic subexponential-time simulations that appear correct with respect to any efficiently sampleable distribution i.o., under the assumption that EXP≠BPP; in contrast, our result does not rely on any unproven assumptions. As another application of our techniques, we get the following gap theorem for ZPP: either every RP algorithm can be simulated by a deterministic subexponential-time algorithm that appears correct i.o. to every efficient adversary, or EXP=ZPP. In particular this implies that if ZPP is somewhat easy, e.g., ZPP⊆DTIME(2(nc)) for some fixed constant c, then RP is subexponentially easy in the uniform setting described above
Keywords :
computational complexity; randomised algorithms; derandomization; deterministic subexponential-time algorithm; deterministic subexponential-time simulations; easiness assumptions; hardness complexity assumptions; hardness tests; probabilistic algorithm; subexponential time; trading time; uniform setting; zero error; zero-error probabilistic algorithm; Boolean functions; Circuits; Computational modeling; Computer errors; Computer science; Computer simulation; Polynomials; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Complexity, 2000. Proceedings. 15th Annual IEEE Conference on
Conference_Location :
Florence
ISSN :
1093-0159
Print_ISBN :
0-7695-0674-7
Type :
conf
DOI :
10.1109/CCC.2000.856746
Filename :
856746
Link To Document :
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