Title :
Scattering-type Near-field Microscopy: From Nanoscale Infrared Material Recognition to Superlens Studies
Author_Institution :
Nano-Photonics Group, Max-Planck-Inst. fur Biochem., Martinsried
Abstract :
We demonstrate that scattering-type near-field optical microscopy (s-SNOM) allows nanoscale resolved infrared mapping of materials and electron concentrations e.g. in cross-sectional samples of semiconductor nanostructures. s-SNOM can be also applied to map the optical near fields of novel photonic structures as we show with a SiC superlens.
Keywords :
infrared imaging; lenses; light scattering; nanostructured materials; near-field scanning optical microscopy; optical materials; wide band gap semiconductors; SiC; electron concentrations; infrared material recognition; nanoscale material recognition; nanoscale resolved infrared mapping; near-field microscopy; optical near fields; photonic structures; scattering-type microscopy; semiconductor nanostructures; superlens; Electron microscopy; Electron optics; Nanostructured materials; Optical materials; Optical microscopy; Optical scattering; Particle scattering; Semiconductor materials; Semiconductor nanostructures; Silicon carbide;
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
DOI :
10.1109/CLEOPR.2007.4391104
