DocumentCode :
2238104
Title :
1500 V, 4 amp 4H-SiC JBS diodes
Author :
Singh, Ranbir ; Ryu, Sei-Hyung ; Palmour, John W. ; Hefner, Allen R. ; Lai, Jason
Author_Institution :
Cree Inc., Durham, NC, USA
fYear :
2000
fDate :
2000
Firstpage :
101
Lastpage :
104
Abstract :
This paper reports the detailed design, fabrication and characterization of 1500 V, 4 Amp 4H-SiC JBS diodes. 2D device simulations show that a grid spacing of 4 μm results in the most optimum trade-off between the on-state and off-state characteristics. JBS diodes with linear and honeycombed p+ grids, Schottky diodes and implanted PiN diodes fabricated alongside show that while 4H-SiC JBS diodes behave similar to Schottky diodes in the on-state and switching characteristics, they show reverse characteristics similar to PiN diodes. Measurements on 4H-SiC JBS diodes indicate that the reverse recovery time (τn) and associated losses are near zero even at a rev. dI/dt of 75 A/μsec. Based on measured waveforms, detailed loss models on diode switching were established for a high frequency switching power supply efficiency evaluation. A DC/DC converter efficiency improvements of 3-6% were obtained over the fastest, lower blocking voltage silicon diode when operated in the 100-200 kHz range
Keywords :
Schottky diodes; p-i-n diodes; semiconductor device models; silicon compounds; wide band gap semiconductors; 1500 V; 2D device simulations; 4 A; 4 amp 4H-SiC JBS diodes; DC/DC converter efficiency; Schottky diodes; SiC; characterizatio; design; diode switching; fabrication; grid spacing; high frequency switching power supply efficiency evaluation; honeycombed p+ grids; implanted PiN diodes; loss models; off-state; on-state; reverse characteristics; reverse recovery time; DC-DC power converters; Fabrication; Frequency measurement; Loss measurement; Power measurement; Power supplies; Schottky diodes; Silicon; Time measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2000. Proceedings. The 12th International Symposium on
Conference_Location :
Toulouse
ISSN :
1063-6854
Print_ISBN :
0-7803-6269-1
Type :
conf
DOI :
10.1109/ISPSD.2000.856782
Filename :
856782
Link To Document :
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