DocumentCode :
2238162
Title :
6.5 kV ultra soft & fast recovery diode (U-SFD) with high reverse recovery capability
Author :
Mori, Mutsuhiro ; Kobayashi, Hideo ; Yasuda, Yasumichi
Author_Institution :
Res. Lab., Hitachi Ltd., Ibaraki, Japan
fYear :
2000
fDate :
2000
Firstpage :
115
Lastpage :
118
Abstract :
This paper presents a 65 kV ultra soft and fast recovery diode (U-SFD) for a high power IGBT module. The U-SFD has shallow p type Schottky junctions and deep pn junctions. A high blocking voltage of 6.8 kV even at -40°C and a low forward voltage drop (VF) Of 4.6 V at 125°C, which show a positive thermal coefficient, are obtained. The Schottky junctions are effective even for 6.5 kV diodes in achieving better trade-off relationships between VF and the reverse recovery loss, VF and the reverse recovery peak current, and VF and the reverse recovery current change compared to a conventional pn diode. Moreover, the U-SFD with a HiRC (high reverse recovery capability) structure demonstrates good switching durability at a high dc-link voltage of 4.4 kV and at 125°C
Keywords :
insulated gate bipolar transistors; power bipolar transistors; power semiconductor diodes; power semiconductor switches; -40 degC; 125 degC; 6.5 kV; Schottky junctions; blocking voltage; deep pn junctions; forward voltage drop; high power IGBT module; positive thermal coefficient; reverse recovery capability; reverse recovery loss; reverse recovery peak current; shallow p type Schottky junctions; switching durability; ultra soft fast recovery diode; Anodes; Cathodes; Circuits; Insulated gate bipolar transistors; Inverters; Low voltage; Power supplies; Schottky diodes; Snubbers; Thyristors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 2000. Proceedings. The 12th International Symposium on
Conference_Location :
Toulouse
ISSN :
1063-6854
Print_ISBN :
0-7803-6269-1
Type :
conf
DOI :
10.1109/ISPSD.2000.856785
Filename :
856785
Link To Document :
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