Title : 
Comparison of high-frequency performance of quasi-SOI and conventional SOI power MOSFETs
         
        
            Author : 
Hiraoka, Yasushi ; Matsumoto, Satoshi ; Sakai, Tatsuo
         
        
            Author_Institution : 
NTT Telecommun. Energy Labs., Kanagawa, Japan
         
        
        
        
        
        
            Abstract : 
We have compared the radio-frequency performance of quasi-SOI and conventional SOI power MOSFETs based on experimentally obtained results and numerical simulation. The quasi-SOI power MOSFET proved to be superior because the activation of the parasitic bipolar transistor was suppressed. We clarified, through a numerical simulation, that the parasitic bipolar effect causes harmonics generation. Especially, the third-order intermodulation distortion of the quasi-SOI device was about 15 dBc lower than that of the conventional SOI device under 2 GHz operation
         
        
            Keywords : 
UHF field effect transistors; harmonic generation; power MOSFET; semiconductor device measurement; semiconductor device models; silicon-on-insulator; 2 GHz; Si-SiO2; conventional SOI power MOSFETs; harmonics generation; high-frequency performance; numerical simulation; parasitic bipolar transistor; quasi-SOI power MOSFETs; radio-frequency performance; third-order intermodulation distortion; Bipolar transistors; Circuit simulation; Electric variables measurement; Immune system; Impurities; Integrated circuit technology; MMICs; MOSFETs; Numerical simulation; Radio frequency;
         
        
        
        
            Conference_Titel : 
Power Semiconductor Devices and ICs, 2000. Proceedings. The 12th International Symposium on
         
        
            Conference_Location : 
Toulouse
         
        
        
            Print_ISBN : 
0-7803-6269-1
         
        
        
            DOI : 
10.1109/ISPSD.2000.856796