Title :
The determination of SPICE Gummel-Poon parameters by a merged optimization-extraction technique
Author :
Seitchik, Jerold A. ; Machala, Charles F., III ; Yang, Ping
Author_Institution :
Texas Instrum., Inc., Dallas, TX, USA
Abstract :
A powerful and flexible bipolar characterization method is presented. The technique is based on a merging of the optimization and extraction approaches that allows; the advantages of both to be retained. Detailed discussions clarify how four aspects of the methodology alleviate the major bipolar parametrization problems. With these procedures a full model may be developed in under an hour. The physical nature of the parameters is retained by fitting to extensive data
Keywords :
bipolar integrated circuits; bipolar transistors; circuit CAD; semiconductor device models; SPICE Gummel-Poon parameters; bipolar characterization method; full model; merged optimization-extraction technique; merging; parametrization; Bipolar transistors; Curve fitting; Data mining; Design optimization; Instruments; Process design; SPICE; Scattering parameters; Semiconductor process modeling; Voltage;
Conference_Titel :
Bipolar Circuits and Technology Meeting, 1989., Proceedings of the 1989
Conference_Location :
Minneapolis, MN
DOI :
10.1109/BIPOL.1989.69507
