• DocumentCode
    22395
  • Title

    Broadband Packaging of Photodetectors for 100 Gb/s Ethernet Applications

  • Author

    Chenhui Jiang ; Krozer, V. ; Bach, H.-G. ; Mekonnen, G.G. ; Johansen, Tom K.

  • Author_Institution
    Electromagn. Syst., Tech. Univ. of Denmark, Lyngby, Denmark
  • Volume
    3
  • Issue
    3
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    422
  • Lastpage
    429
  • Abstract
    The packing structure of functional modules is a major limitation in achieving a desired performance for 100 Gb/s ethernet applications. This paper presents a methodology of developing advanced packaging of photodetectors (PDs) for highspeed data transmission applications by using 3-D electromagnetic (EM) simulations. A simplified model of the PD module is first used to analyze and optimize packaging structures and propose an optimal packaging design based on the simplified model. Although a PD module with improved performance proved the success of the optimal packaging design, the simplified model could not identify other important bandwidth limitation effects. Therefore, a full 3-D EM model of PD modules is developed to predict the optical-to-electrical response of the module, and with this model, it is possible to identify a critical mode mismatch effect as another important factor of limiting the bandwidth of PD modules. After eliminating the mode mismatch effect by improving the chip-conductor-backed coplanar waveguide transition, a final optimal packaging structure is implemented for the PD module with reduced attenuation up to 100 GHz and a broader 3-dB bandwidth of more than 90 GHz. Furthermore, the PD module exhibits excellent performance under the high-speed data-transmission experiment with 107 Gb/s data rate.
  • Keywords
    coplanar waveguides; electronics packaging; lead bonding; local area networks; optimisation; optoelectronic devices; photodetectors; 3D EM simulations; Ethernet applications; PD module; bit rate 100 Gbit/s; bit rate 107 Gbit/s; chip-conductor-backed coplanar waveguide transition; high-speed data transmission applications; optical-to-electrical response; optimal packaging design; packaging structure analysis; packaging structure optimization; photodetector broadband packaging; three-dimensional electromagnetic simulations; Attenuation; Bandwidth; Connectors; Insertion loss; Packaging; Semiconductor device measurement; Solid modeling; 3-D electromagnetic (EM) modeling; 3-dB bandwidth; mode mismatch; packaging; photodetector (PD);
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2012.2236149
  • Filename
    6416951