DocumentCode :
22395
Title :
Broadband Packaging of Photodetectors for 100 Gb/s Ethernet Applications
Author :
Chenhui Jiang ; Krozer, V. ; Bach, H.-G. ; Mekonnen, G.G. ; Johansen, Tom K.
Author_Institution :
Electromagn. Syst., Tech. Univ. of Denmark, Lyngby, Denmark
Volume :
3
Issue :
3
fYear :
2013
fDate :
Mar-13
Firstpage :
422
Lastpage :
429
Abstract :
The packing structure of functional modules is a major limitation in achieving a desired performance for 100 Gb/s ethernet applications. This paper presents a methodology of developing advanced packaging of photodetectors (PDs) for highspeed data transmission applications by using 3-D electromagnetic (EM) simulations. A simplified model of the PD module is first used to analyze and optimize packaging structures and propose an optimal packaging design based on the simplified model. Although a PD module with improved performance proved the success of the optimal packaging design, the simplified model could not identify other important bandwidth limitation effects. Therefore, a full 3-D EM model of PD modules is developed to predict the optical-to-electrical response of the module, and with this model, it is possible to identify a critical mode mismatch effect as another important factor of limiting the bandwidth of PD modules. After eliminating the mode mismatch effect by improving the chip-conductor-backed coplanar waveguide transition, a final optimal packaging structure is implemented for the PD module with reduced attenuation up to 100 GHz and a broader 3-dB bandwidth of more than 90 GHz. Furthermore, the PD module exhibits excellent performance under the high-speed data-transmission experiment with 107 Gb/s data rate.
Keywords :
coplanar waveguides; electronics packaging; lead bonding; local area networks; optimisation; optoelectronic devices; photodetectors; 3D EM simulations; Ethernet applications; PD module; bit rate 100 Gbit/s; bit rate 107 Gbit/s; chip-conductor-backed coplanar waveguide transition; high-speed data transmission applications; optical-to-electrical response; optimal packaging design; packaging structure analysis; packaging structure optimization; photodetector broadband packaging; three-dimensional electromagnetic simulations; Attenuation; Bandwidth; Connectors; Insertion loss; Packaging; Semiconductor device measurement; Solid modeling; 3-D electromagnetic (EM) modeling; 3-dB bandwidth; mode mismatch; packaging; photodetector (PD);
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2012.2236149
Filename :
6416951
Link To Document :
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