Title :
Total Internal Reflection Microscopy for Surface Plasmon Scattering of a Single Cu Nanowire
Author :
Yim, Sang-Youp ; Ahn, Hong-Gyu ; Kim, Dae-Geun ; Je, Koo-Chul ; Ju, Honglyoul ; Choi, Moohyun ; Park, Chang Woo ; Park, Seung-Han
Author_Institution :
Nat. Res. Lab. of Nonlinear Opt., Yonsei Univ., Seoul
Abstract :
A total internal reflection microscope was constructed to study surface plasmon scattering spectra of a single Cu nanowire. In particular, we have observed a strong surface plasmon peak in deep red region and the red-shift of the surface plasmon resonance as the diameter increases.
Keywords :
copper; nanowires; optical fabrication; optical microscopy; surface plasmons; Cu; internal reflection microscopy; nanowire; surface plasmon resonance; surface plasmon scattering; Copper; Glass; Optical microscopy; Optical reflection; Optical scattering; Optical surface waves; Plasmons; Resonance light scattering; Scanning electron microscopy; Transmission electron microscopy;
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
DOI :
10.1109/CLEOPR.2007.4391204
