Title : 
Convergence Analysis of Multiplicative Weight Noise Injection During Training
         
        
            Author : 
Ho, Kevin ; Leung, Chi-Sing ; Sum, John ; Lau, Siu-chung
         
        
            Author_Institution : 
Dept. of Comput. Sci. & Commun. Eng., Providence Univ., Sha-Lu, Taiwan
         
        
        
        
        
        
            Abstract : 
Injecting weight noise during training has been proposed for almost two decades as a simple technique to improve fault tolerance and generalization of a multilayer perceptron (MLP). However, little has been done regarding their convergence behaviors. Therefore, we presents in this paper the convergence proofs of two of these algorithms for MLPs. One is based on combining injecting multiplicative weight noise and weight decay (MWN-WD) during training. The other is based on combining injecting additive weight noise and weight decay (AWN-WD) during training. Let m be the number of hidden nodes of a MLP, a be the weight decay constant and Sb be the noise variance. It is showed that the convergence of MWN-WD algorithm is with probability one if a >; √(Sb)m. While the convergence of the AWN-WD algorithm is with probability one if a >; 0.
         
        
            Keywords : 
fault tolerance; learning (artificial intelligence); multilayer perceptrons; probability; AWN-WD algorithm; MWN-WD algorithm; additive weight noise; convergence analysis; convergence behavior; convergence proof; fault tolerance; multilayer perceptron; multiplicative weight noise injection; noise variance; probability; training; weight decay; MLP; convergence; learning; weight noise;
         
        
        
        
            Conference_Titel : 
Technologies and Applications of Artificial Intelligence (TAAI), 2010 International Conference on
         
        
            Conference_Location : 
Hsinchu City
         
        
            Print_ISBN : 
978-1-4244-8668-7
         
        
            Electronic_ISBN : 
978-0-7695-4253-9
         
        
        
            DOI : 
10.1109/TAAI.2010.64