DocumentCode :
2240096
Title :
Copper wire bond on MCM device (bond stitch on bump ball)
Author :
Tan Boo Wei ; Niu You Hua
Author_Institution :
Group Engineering Manager, Carsem Suzhou, China
fYear :
2012
fDate :
6-8 Nov. 2012
Abstract :
Copper wire bonding is becoming popular on multi chip (MCM) device in parallel with the general industry trend of integrating more functions into single product. In order to support device to device interconnect; bond stitch on ball (BSOB) bonding method is quite generally used in the industry. However, copper wire due to its material hardness is more difficult to be manufactured into BSOB as compared to gold wire. In this paper, key challenges for copper wire bond BSOB and its solutions are discussed. Problem solving methodology including copper material selection, bonding tool (capillary) design, bonding concept and special wire bond software features will be explored to develop robust process window for copper wire bonding with good reliability and production worthy.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location :
Ipoh, Perak, Malaysia
ISSN :
1089-8190
Print_ISBN :
978-1-4673-4384-8
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2012.6521750
Filename :
6521750
Link To Document :
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