• DocumentCode
    2240401
  • Title

    Picosecond Time Resolved X-ray Diffraction Measurements of Coherent Phonons and Carrier Dynamics at a Buried Interface

  • Author

    Lee, S.H. ; Fritz, D.M. ; Sheu, Yu-Miin ; Goldman, R.S. ; Walko, Don ; Landhal, Eric ; Reis, D.A.

  • Author_Institution
    Korea Res. Inst. of Stand. & Sci., Daejeon
  • fYear
    2007
  • fDate
    26-31 Aug. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We present time resolved X-ray diffraction (TRXD) experiments on the transport of a coherent acoustic wave-packet and nonlinear carrier relaxation processes across the nearly ideal AlGaAs/GaAs interface. A femtosecond laser impulsively excites the underlying substrate such that the coherent acoustic phonons take the form of two counter propagating unipolar strain pulses and associated hot carrier dynamics. Picosecond TRXD is used to observe the laser-induced strain separately for the film and substrate.
  • Keywords
    III-V semiconductors; X-ray diffraction; aluminium compounds; gallium arsenide; phonons; AlGaAs-GaAs; carrier dynamics; coherent acoustic wave-packet; coherent phonons; hot carrier dynamics; nonlinear carrier relaxation processes; picosecond time resolved X-ray diffraction; unipolar strain pulses; Acoustic diffraction; Acoustic measurements; Acoustic pulses; Acoustic waves; Capacitive sensors; Nonlinear acoustics; Phonons; Substrates; Time measurement; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-1173-3
  • Electronic_ISBN
    978-1-4244-1174-0
  • Type

    conf

  • DOI
    10.1109/CLEOPR.2007.4391239
  • Filename
    4391239