DocumentCode
2240401
Title
Picosecond Time Resolved X-ray Diffraction Measurements of Coherent Phonons and Carrier Dynamics at a Buried Interface
Author
Lee, S.H. ; Fritz, D.M. ; Sheu, Yu-Miin ; Goldman, R.S. ; Walko, Don ; Landhal, Eric ; Reis, D.A.
Author_Institution
Korea Res. Inst. of Stand. & Sci., Daejeon
fYear
2007
fDate
26-31 Aug. 2007
Firstpage
1
Lastpage
2
Abstract
We present time resolved X-ray diffraction (TRXD) experiments on the transport of a coherent acoustic wave-packet and nonlinear carrier relaxation processes across the nearly ideal AlGaAs/GaAs interface. A femtosecond laser impulsively excites the underlying substrate such that the coherent acoustic phonons take the form of two counter propagating unipolar strain pulses and associated hot carrier dynamics. Picosecond TRXD is used to observe the laser-induced strain separately for the film and substrate.
Keywords
III-V semiconductors; X-ray diffraction; aluminium compounds; gallium arsenide; phonons; AlGaAs-GaAs; carrier dynamics; coherent acoustic wave-packet; coherent phonons; hot carrier dynamics; nonlinear carrier relaxation processes; picosecond time resolved X-ray diffraction; unipolar strain pulses; Acoustic diffraction; Acoustic measurements; Acoustic pulses; Acoustic waves; Capacitive sensors; Nonlinear acoustics; Phonons; Substrates; Time measurement; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location
Seoul
Print_ISBN
978-1-4244-1173-3
Electronic_ISBN
978-1-4244-1174-0
Type
conf
DOI
10.1109/CLEOPR.2007.4391239
Filename
4391239
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