DocumentCode
2240710
Title
Using a mismatch transmission line to verify accuracy of a high performance noise figure measurement system
Author
Wong, Ken ; Pollard, Roger ; Shoulders, Bob ; Rhymes, Lynn
Author_Institution
Agilent Technol., Inc., Santa Rosa, CA, USA
fYear
2007
fDate
8-8 June 2007
Firstpage
1
Lastpage
5
Abstract
To verify noise figure measurement accuracy, an amplifier fully characterized by a reference laboratory may be used. The uncertainty of such a method is quite large because amplifier noise characteristics drift with temperature and time and quite sensitive to DC bias conditions. Since the noise characteristics of a passive 2-port network are directly related to its S-parameters, its measured noise figure can be directly traceable to S-parameter measurements. Passive 2-port devices such as matched through devices, isolators and 2-port networks that simulate the mismatch characteristics of an amplifier had been proposed. It had been demonstrated that no passive devices can fully verify the wide range of noise figure measurement conditions. More recently, the preferred verification method is to use a passive two port network cascaded with an amplifier. These passive 2-port networks typically provide a limited range of mismatch conditions that the amplifier interacts with and therefore do not fully quantify the operating range of a high performance noise figure measurement system. A mismatch transmission line (Beatty Line) provides a wide range of match conditions over a very wide bandwidth. This paper demonstrates how such a device can be used to verify a high performance noise figure measurement system.
Keywords
S-parameters; measurement uncertainty; microwave measurement; noise measurement; transmission lines; S-parameters; high performance noise figure measurement system; mismatch transmission line; Circuit noise; Electric variables measurement; Isolators; Laboratories; Noise figure; Noise measurement; Scattering parameters; Temperature sensors; Transmission line matrix methods; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference, 2007 69th
Conference_Location
Honolulu, HI
Print_ISBN
978-0-7803-9762-0
Electronic_ISBN
978-0-7803-9763-7
Type
conf
DOI
10.1109/ARFTG.2007.5456324
Filename
5456324
Link To Document