DocumentCode :
2240754
Title :
Study on reliability test of die attach material
Author :
Lim Chuan Yik ; Yap Boon Kar ; Nor Shafika
Author_Institution :
Electronics and Communication Eng. Dept, Universiti Tenaga Nasional, Jalan IKRAM-UNITEN, 43009 Kajang, Selangor, Malaysia
fYear :
2012
fDate :
6-8 Nov. 2012
Firstpage :
1
Lastpage :
7
Abstract :
Silver plated copper is a new developed die attachment material to replace pure silver. As year past, price of silver getting higher and become a problem for those semiconductors packaging company. Therefore, silver plated copper was developed as new die attachment material to solve the costing problem. But the characteristic and reliability of silver plated copper filler has be a doubt to replace the pure silver in the market. This paper will review few test method to test on the reliability of silver plated copper filler and proved that it is as good as silver to be the filler.
Keywords :
copper; filler; reliability; silver; test method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location :
Ipoh, Perak, Malaysia
ISSN :
1089-8190
Print_ISBN :
978-1-4673-4384-8
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2012.6521776
Filename :
6521776
Link To Document :
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