Title :
Study on reliability test of die attach material
Author :
Lim Chuan Yik ; Yap Boon Kar ; Nor Shafika
Author_Institution :
Electronics and Communication Eng. Dept, Universiti Tenaga Nasional, Jalan IKRAM-UNITEN, 43009 Kajang, Selangor, Malaysia
Abstract :
Silver plated copper is a new developed die attachment material to replace pure silver. As year past, price of silver getting higher and become a problem for those semiconductors packaging company. Therefore, silver plated copper was developed as new die attachment material to solve the costing problem. But the characteristic and reliability of silver plated copper filler has be a doubt to replace the pure silver in the market. This paper will review few test method to test on the reliability of silver plated copper filler and proved that it is as good as silver to be the filler.
Keywords :
copper; filler; reliability; silver; test method;
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location :
Ipoh, Perak, Malaysia
Print_ISBN :
978-1-4673-4384-8
Electronic_ISBN :
1089-8190
DOI :
10.1109/IEMT.2012.6521776