• DocumentCode
    2240754
  • Title

    Study on reliability test of die attach material

  • Author

    Lim Chuan Yik ; Yap Boon Kar ; Nor Shafika

  • Author_Institution
    Electronics and Communication Eng. Dept, Universiti Tenaga Nasional, Jalan IKRAM-UNITEN, 43009 Kajang, Selangor, Malaysia
  • fYear
    2012
  • fDate
    6-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Silver plated copper is a new developed die attachment material to replace pure silver. As year past, price of silver getting higher and become a problem for those semiconductors packaging company. Therefore, silver plated copper was developed as new die attachment material to solve the costing problem. But the characteristic and reliability of silver plated copper filler has be a doubt to replace the pure silver in the market. This paper will review few test method to test on the reliability of silver plated copper filler and proved that it is as good as silver to be the filler.
  • Keywords
    copper; filler; reliability; silver; test method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
  • Conference_Location
    Ipoh, Perak, Malaysia
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4673-4384-8
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2012.6521776
  • Filename
    6521776