The modified ripple test for on-wafer S-parameter measurements

This paper addresses the background, implementation, and the on-wafer measurement results of an automatic analysis of the accuracy of S-parameters. The classic ripple-test is automated and expanded to the use of a dispersive transmission line as a reference. Consequently, it was the first time a dispersive coplanar line was used for the ripple-test. The novel technique is illustrated through a number of examples. Numerical and measurement results have verified the proposed method.