DocumentCode :
2240950
Title :
Error propagation from OSL calibration standards: Analytical solution and experimental validation
Author :
Han, Yufeng
Author_Institution :
ENI products, MKS Instrum., Rochester, NY, USA
fYear :
2007
fDate :
8-8 June 2007
Firstpage :
1
Lastpage :
7
Abstract :
OSL (Open-Short-Load) calibration is the commonly used technique for one-port RF reflection/impedance measurement. Generally, the calibration standards are assumed to be ¿perfect¿ or traceable to ¿perfect standards¿. With no doubts, the imperfections on calibration standards or process of traceability will create a second-level error for measurement. Recent attempts focus on predicting the second-level error with numerical simulations. However, direct analytical expression and experimental validation have not been demonstrated yet. In this paper, analytical solution to error propagation from OSL calibration standards is derived with introducing small perturbations to these standards and using first-order approximations. It leads to sensitivity analysis for OSL calibration with imperfect standards. In order to validate the analysis, a female-to-male adapter is adopted as an error source for OSL calibration standards. By comparing the reflection measurements for the cases of calibration with/without the adapter, the analytical solution is validated experimentally.
Keywords :
electric impedance measurement; error analysis; OSL calibration standards; error propagation; female-to-male adapter; one-port RF reflection/impedance measurement; open-short-load calibration; Calibration; Error analysis; Impedance measurement; Measurement standards; Numerical simulation; RF signals; Radio frequency; Reflection; Sensitivity analysis; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference, 2007 69th
Conference_Location :
Honolulu, HI
Print_ISBN :
978-0-7803-9762-0
Electronic_ISBN :
978-0-7803-9763-7
Type :
conf
DOI :
10.1109/ARFTG.2007.5456334
Filename :
5456334
Link To Document :
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