• DocumentCode
    2241087
  • Title

    [Title page i]

  • fYear
    2009
  • fDate
    3-7 May 2009
  • Abstract
    Conference proceedings title page.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2009. VTS '09. 27th IEEE
  • Conference_Location
    Santa Cruz, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-0-7695-3598-2
  • Type

    conf

  • DOI
    10.1109/VTS.2009.1
  • Filename
    5116588