DocumentCode
2241112
Title
[Title page iii]
fYear
2009
fDate
3-7 May 2009
Abstract
The following topics are dealt with: microprocessor test; delay fault testing; signal integrity; BIST; built-in self test; transistor aging; power supply noise; and integrated circuit chip.
Keywords
ageing; built-in self test; circuit testing; microprocessor chips; transistors; built-in self test; delay fault testing; integrated circuit chip; microprocessor test; power supply noise; signal integrity; transistor aging;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location
Santa Cruz, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3598-2
Type
conf
DOI
10.1109/VTS.2009.2
Filename
5116589
Link To Document