DocumentCode
2241186
Title
Foreword
fYear
2009
fDate
3-7 May 2009
Abstract
Presents the welcome message from the conference proceedings.
Keywords
Circuit faults; Circuit testing; Conferences; Educational programs; Integrated circuit testing; Power system modeling; Semiconductor device testing; Signal design; System testing; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location
Santa Cruz, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3598-2
Type
conf
DOI
10.1109/VTS.2009.4
Filename
5116592
Link To Document