DocumentCode :
2241186
Title :
Foreword
fYear :
2009
fDate :
3-7 May 2009
Abstract :
Presents the welcome message from the conference proceedings.
Keywords :
Circuit faults; Circuit testing; Conferences; Educational programs; Integrated circuit testing; Power system modeling; Semiconductor device testing; Signal design; System testing; Technological innovation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3598-2
Type :
conf
DOI :
10.1109/VTS.2009.4
Filename :
5116592
Link To Document :
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