Title :
Tuning range analysis of load pull measurement systems and impedance transforming networks
Author :
Sirois, Jerome ; Noori, Basim
Author_Institution :
Freescale Semicond., Tempe, AZ, USA
Abstract :
This paper studies, by mean of a mapping between the Smith chart and impedance plot, the different aspects that impact the tunable range at the DUT reference plane in a passive load pull measurement system. The utilization of an impedance transforming fixture is considered and the technique to choose the right transformation ratio is presented. Finally, a method to encircle the absolute tunable region of a load pull system is explained, considering the use of any impedance transforming network.
Keywords :
impedance convertors; microwave transistors; semiconductor device measurement; RF transistors; impedance transforming networks; load pull measurement systems; tuning range analysis; Calibration; Costs; Fixtures; Impedance measurement; Power generation; Process design; Radio frequency; Reflection; Tunable circuits and devices; Tuners; Load pull measurement; impedance transforming fixtures;
Conference_Titel :
ARFTG Conference, 2007 69th
Conference_Location :
Honolulu, HI
Print_ISBN :
978-0-7803-9762-0
Electronic_ISBN :
978-0-7803-9763-7
DOI :
10.1109/ARFTG.2007.5456348
