Abstract :
The following topics are dealt with: active device characterization; multiport measurements; differential measurements; on-wafer microwave measurements; linear vector network analysis; and complex waveform analysis.
Keywords :
active networks; linear network analysis; microwave measurement; multiport networks; active device characterization; complex waveform analysis; differential measurements; linear vector network analysis; multiport measurements; on-wafer microwave measurements;
Conference_Titel :
ARFTG Conference, 2007 69th
Conference_Location :
Honolulu, HI
Print_ISBN :
978-0-7803-9762-0
DOI :
10.1109/ARFTG.2007.5456351
