Title :
Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells
Author :
Hu, Yong-Jyun ; Huang, Yu-Jen ; Li, Jin-Fu
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
Abstract :
Ternary content addressable memory (TCAM) is a key component in various applications for its fast lookup operation. Symmetric and asymmetric TCAM cells are two widely used cells for implementing a TCAM array. This paper presents several comparison fault models of TCAMs with asymmetric cells based on electrical defects. Some new comparison faults which do not exist in a TCAM with symmetric cells are found. A march-like test algorithm is also proposed to cover the defined comparison faults. The test algorithm consists of 8N Write operations and (3N + 2B) Compare operations for an N times B-bit TCAM with Hit output only.
Keywords :
content-addressable storage; fault diagnosis; 8N Write operations; TCAM; asymmetric cell; electrical defect; fault model; march-like test algorithm; ternary content addressable memory; Associative memory; Decoding; Hardware; Logic; Prefetching; Random access memory; Routing; Signal generators; Testing; Very large scale integration; March-like test; Ternary Content Addressable memory; comparison faults; fault modeling;
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
978-0-7695-3598-2
DOI :
10.1109/VTS.2009.18
