Title :
Catastrophic optical damage at front and rear facets of 975 nm emitting diode lasers
Author :
Hempel, M. ; Tomm, J.W. ; Ziegler, M. ; Elsaesser, T. ; Michel, N. ; Krakowski, M.
Author_Institution :
Max-Born-Inst., Berlin, Germany
Abstract :
Catastrophic facet degradation at highest power levels is analyzed for different diode laser waveguide architectures. Degradation events at front and rear facet are analyzed and predominant damage at the rear is elucidated for Al-free waveguides.
Keywords :
quantum well lasers; waveguide lasers; catastrophic facet degradation; catastrophic optical damage; diode laser waveguide architectures; edge-emitting diode lasers; wavelength 975 nm; Degradation; Diode lasers; Heating; Optical pulses; Optical waveguides; Surface emitting lasers; Waveguide lasers;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
