Title :
Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing
Author_Institution :
Broadcom Corp., San Jose, CA, USA
Abstract :
About half of the logic circuit transistors of a modern integrated circuit design reside inside the scan flip-flops. Even though prior work analyzed detection of defects in traditional master-slave flip-flop circuits, to the best of our knowledge, this work is the first one regarding detection of defects in a sense-amplifier-based flip-flop, which is a preferred design style in some high-speed low-power designs. In this work, we uncover a class of resistive open and resistive short defects in such a flip-flop design, which show a great difference in their detection response to launch-off-shift versus launch-off-capture due to their sensitivity to clock-gating and data input transitions.
Keywords :
flip-flops; high-speed integrated circuits; integrated circuit design; integrated logic circuits; logic testing; low-power electronics; clock gating; data input transition; defect detection; flip-flop design; high-speed low-power design; integrated circuit design; launch-off-capture; launch-off-shift; logic circuit transistors; resistive open defects; resistive short defects; sense-amplifier-based flip-flop testing; Circuit testing; Clocks; Fault detection; Flip-flops; Integrated circuit testing; Logic circuits; Logic testing; MOS devices; Master-slave; Switches; Launch-Off-Capture; Launch-Off_Shift; Sense-amplifier-based flip-flop testing;
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
978-0-7695-3598-2
DOI :
10.1109/VTS.2009.39
