Title :
Self-consistent parameter extraction for simulation models
Author :
Halen, Paul Van ; Duepner, Teresa ; Entrikin, David ; Simpkins, Shaun ; Severson, Fred
Author_Institution :
Dept. of Electr. Eng., Portland State Univ., OR, USA
Abstract :
An approach to deriving model parameters in which unique extraction algorithms are developed for each model form is described. Only after consistent extraction routines are developed for the model within a circuit simulator are then applied to the physical device. This provides an exact operational definition for each model parameter. Subsequent optimization, often considered unavoidable, can thus be reduced or eliminated. This approach is the basis of a SPICE model characterization system based on the Tekspice circuit simulator. Bipolar device measurement and Gummel-Poon extraction algorithms created with this system are demonstrated
Keywords :
bipolar integrated circuits; bipolar transistors; digital simulation; semiconductor device models; Gummel-Poon extraction algorithms; SPICE model characterization system; Tekspice circuit simulator; circuit simulator; exact operational definition; extraction algorithms; model parameters; self-consistent parameter extraction; simulation models; Circuit simulation; Constraint optimization; Data mining; Design engineering; Integrated circuit measurements; Integrated circuit modeling; Integrated circuit technology; Mathematical model; Parameter extraction; SPICE;
Conference_Titel :
Bipolar Circuits and Technology Meeting, 1989., Proceedings of the 1989
Conference_Location :
Minneapolis, MN
DOI :
10.1109/BIPOL.1989.69508