Title :
Precision Length Metrology based on Optical Frequency Synthesizer
Author :
Jin, Jonghan ; Kim, Young-Jin ; Kim, Yunseok ; Hyun, Sangwon ; Kim, Seung-Woo
Author_Institution :
Billionth Uncertainty Precision Eng., Korea Adv. Instituteof Sci. & Technol., Seoul
Abstract :
Emerging possibilities for advanced optical metrology using the optical frequency synthesizer are addressed with emphasis on absolute distance measurements. The synthesizer is constructed by tuning an external cavity laser diode to the optical comb of a femtosecond pulse laser, which encompasses monochromatic laser lines evenly spaced over a wide spectral range.
Keywords :
distance measurement; frequency synthesizers; high-speed optical techniques; laser cavity resonators; laser tuning; length measurement; measurement by laser beam; optical variables measurement; absolute distance measurements; external cavity laser diode; femtosecond pulse laser; laser diode tuning; optical comb; optical frequency synthesizer; optical metrology; precision length metrology; Atom optics; Bandwidth; Frequency synthesizers; Laser modes; Laser tuning; Metrology; Optical interferometry; Optical pulses; Optical refraction; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1173-3
Electronic_ISBN :
978-1-4244-1174-0
DOI :
10.1109/CLEOPR.2007.4391293
