Precision Length Metrology based on Optical Frequency Synthesizer

Author

Jin, Jonghan ; Kim, Young-Jin ; Kim, Yunseok ; Hyun, Sangwon ; Kim, Seung-Woo

Author_Institution

Billionth Uncertainty Precision Eng., Korea Adv. Instituteof Sci. & Technol., Seoul

fYear

2007

fDate

26-31 Aug. 2007

Firstpage

1

Lastpage

2

Abstract

Emerging possibilities for advanced optical metrology using the optical frequency synthesizer are addressed with emphasis on absolute distance measurements. The synthesizer is constructed by tuning an external cavity laser diode to the optical comb of a femtosecond pulse laser, which encompasses monochromatic laser lines evenly spaced over a wide spectral range.

Keywords

distance measurement; frequency synthesizers; high-speed optical techniques; laser cavity resonators; laser tuning; length measurement; measurement by laser beam; optical variables measurement; absolute distance measurements; external cavity laser diode; femtosecond pulse laser; laser diode tuning; optical comb; optical frequency synthesizer; optical metrology; precision length metrology; Atom optics; Bandwidth; Frequency synthesizers; Laser modes; Laser tuning; Metrology; Optical interferometry; Optical pulses; Optical refraction; Ultrafast optics;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on

Conference_Location

Seoul

Print_ISBN

978-1-4244-1173-3

Electronic_ISBN

978-1-4244-1174-0

Type

conf

DOI

10.1109/CLEOPR.2007.4391293

Filename

4391293