DocumentCode :
2241739
Title :
Signal sensitivity to supply noise on high-speed I/O
Author :
Siang Rui Chan ; Fern Nee Tan ; Mohd-Mokhtar, Rosmiwati
Author_Institution :
Intel Microelectron. (M) Sdn. Bhd, Bayan Lepas, Malaysia
fYear :
2012
fDate :
6-8 Nov. 2012
Firstpage :
1
Lastpage :
6
Abstract :
Power Distribution Network (PDN) is optimized based on conventional AC and DC noise target specification. Large supply noise occurs due to increase in speed and number of I/O running simultaneously. In this paper, an alternate means to quantify supply noise to signal performance is discussed. Discussion focuses on signal performance impact caused by supply noise with different frequency content. Simulation is carried out using transistor model and findings are then correlated through lab measurements. Using USB I/O as a test case, findings conclude that the USB transmitter performance is less sensitive to supply noise at circuit operating frequency (480 MHz) and its harmonic. Hence, excessive AC noise at its less sensitive region will not cause signal eye diagram to fail.
Keywords :
UHF transistors; semiconductor device models; semiconductor device noise; sensitivity analysis; transistors; AC noise target specification; DC noise target specification; PDN; USB I/O; USB transmitter performance; frequency 480 MHz; high-speed I/O; large supply noise; power distribution network; signal eye diagram; signal performance impact; signal sensitivity-to-supply noise; supply noise-to-signal performance; transistor model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location :
Ipoh
ISSN :
1089-8190
Print_ISBN :
978-1-4673-4384-8
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2012.6521813
Filename :
6521813
Link To Document :
بازگشت