DocumentCode

2241810

Title

DFT and Test Problems from the Trenches

Author

Konuk, Haluk

fYear

2009

fDate

3-7 May 2009

Firstpage

120

Lastpage

120

Keywords

Testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2009. VTS '09. 27th IEEE

Conference_Location

Santa Cruz, CA, USA

ISSN

1093-0167

Print_ISBN

978-0-7695-3598-2

Type

conf

DOI

10.1109/VTS.2009.63

Filename

5116620