DocumentCode :
2241810
Title :
DFT and Test Problems from the Trenches
Author :
Konuk, Haluk
fYear :
2009
fDate :
3-7 May 2009
Firstpage :
120
Lastpage :
120
Keywords :
Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA, USA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3598-2
Type :
conf
DOI :
10.1109/VTS.2009.63
Filename :
5116620
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2241810
