DocumentCode
2241979
Title
SD3: A Scalable Approach to Dynamic Data-Dependence Profiling
Author
Kim, Minjang ; Kim, Hyesoon ; Luk, Chi-Keung
Author_Institution
Sch. of Comput. Sci., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2010
fDate
4-8 Dec. 2010
Firstpage
535
Lastpage
546
Abstract
As multicore processors are deployed in mainstream computing, the need for software tools to help parallelize programs is increasing dramatically. Data-dependence profiling is an important technique to exploit parallelism in programs. More specifically, manual or automatic parallelization can use the outcomes of data-dependence profiling to guide where to parallelize in a program. However, state-of-the-art data-dependence profiling techniques are not scalable as they suffer from two major issues when profiling large and long-running applications: (1) runtime overhead and (2) memory overhead. Existing data-dependence profilers are either unable to profile large-scale applications or only report very limited information. In this paper, we propose a scalable approach to data-dependence profiling that addresses both runtime and memory overhead in a single framework. Our technique, called SD3, reduces the runtime overhead by parallelizing the dependence profiling step itself. To reduce the memory overhead, we compress memory accesses that exhibit stride patterns and compute data dependences directly in a compressed format. We demonstrate that SD3 reduces the runtime overhead when profiling SPEC 2006 by a factor of 4.1× and 9.7× on eight cores and 32 cores, respectively. For the memory overhead, we successfully profile SPEC 2006 with the reference input, while the previous approaches fail even with the train input. In some cases, we observe more than a 20× improvement in memory consumption and a 16× speedup in profiling time when 32 cores are used.
Keywords
multiprocessing systems; parallel programming; program compilers; program diagnostics; software tools; SD3; SPEC 2006; automatic parallelization; compress memory access; dynamic data dependence profiling; mainstream computing; memory overhead; multicore processor; parallelize program; runtime overhead; scalable approach; software tool; stride pattern; compression; data dependence; parallel programming; parallelization; profiling; program analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microarchitecture (MICRO), 2010 43rd Annual IEEE/ACM International Symposium on
Conference_Location
Atlanta, GA
ISSN
1072-4451
Print_ISBN
978-1-4244-9071-4
Type
conf
DOI
10.1109/MICRO.2010.49
Filename
5695564
Link To Document