DocumentCode :
22420
Title :
Enhancement of Hole Confinement by Monolayer Insertion in Asymmetric Quantum-Barrier UVB Light Emitting Diodes
Author :
Janjua, Bilal ; Ng, Tien Khee ; Alyamani, Ahmed Y. ; El-Desouki, Munir M. ; Ooi, Boon S.
Author_Institution :
Comput., Electr. & Math. Sci. & Eng. (CEMSE) Div., King Abdullah Univ. of Sci. & Technol. (KAUST), Thuwal, Saudi Arabia
Volume :
6
Issue :
2
fYear :
2014
fDate :
Apr-14
Firstpage :
1
Lastpage :
9
Abstract :
We study the enhanced hole confinement by having a large bandgap AlGaN monolayer insertion (MLI) between the quantum well (QW) and the quantum barrier (QB). The numerical analysis examines the energy band alignment diagrams, using a self-consistent 6 × 6 k ·p method and, considering carrier distribution, recombination rates (Shockley-Reed-Hall, Auger, and radiative recombination rates), under equilibrium and forward bias conditions. The active region is based on AlaGa1-aN (barrier)/AlbGa1-bN (MLI)/AlcGa1-cN (well)/AldGa1-dN (barrier), where b d a c. A large bandgap AlbGa1 - bN mono layer, inserted between the QW and QB, was found to be effective in providing stronger hole confinement. With the proposed band engineering scheme, an increase of more than 30% in spatial overlap of carrier wavefunction was obtained, with a considerable increase in carrier density and direct radiative recombination rates. The single-QW-based UV-LED was designed to emit at 280 nm, which is an effective wavelength for water disinfection.
Keywords :
Auger effect; III-V semiconductors; aluminium compounds; electron-hole recombination; gallium compounds; k.p calculations; light emitting diodes; monolayers; semiconductor quantum wells; wave functions; wide band gap semiconductors; AlGaN; Auger recombination rates; MLI; Shockley-Reed-Hall recombination rates; asymmetric quantum-barrier UVB light emitting diodes; carrier density; carrier distribution; carrier wavefunction; direct radiative recombination rates; energy band alignment diagrams; enhanced hole confinement; hole confinement; monolayer insertion; numerical analysis; radiative recombination rates; recombination rates; self-consistent 6 × 6 k ·p method; water disinfection; Aluminum gallium nitride; Charge carrier density; Charge carrier processes; III-V semiconductor materials; Light emitting diodes; Radiative recombination; Light emitting diodes (LEDs); energy barrier; semiconductor quantum well; thin insertion layer; ultraviolet; water disinfection; wavefunction overlap;
fLanguage :
English
Journal_Title :
Photonics Journal, IEEE
Publisher :
ieee
ISSN :
1943-0655
Type :
jour
DOI :
10.1109/JPHOT.2014.2310199
Filename :
6758387
Link To Document :
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